论文代写：电子显微镜成像原理及特性
扫描电子显微镜是在1937年第一次使用。它是基于几个物理的基本原则有二次电子的存在,和简单的电流和传播电子背散射电子,cathodoluminesence和特征x射线。文档包含一个阐述各种成像理论的对比,空间分辨率的二次电子的组件以及它们是如何影响并发合成图像的分辨率。空间分辨率的各种工作规范标准也详细讨论。此外,背散射电子的元素及其对x射线成像技术已经彻底的影响进行了讨论。扫描电子显微镜的引入是紧随其后的是实验的结果分析和部分由各种标本样品拍照提供说明性的例子解释的原则。结果后的论坛部分分析了各种物理特性的影响,如工作距离和电压对图像质量和分辨率的影响。
论文代写：电子显微镜成像原理及特性
The scanning electron microscope was first utilized in the year 1937. It is based on several fundamental principles of physics which employs the presence of secondary electrons, backscattered electrons and simple current and transmitted electrons, cathodoluminesence and characteristics x-rays. The document consists of an elaboration on the various theories of imaging contrasts, the components of spatial resolution of secondary electrons and how they affect the concurrent resolution of the resultant image. The various working specifications of the spatial resolution criteria is also discussed in detail. Furthermore, the element of backscattered electrons and their effects on x-ray imaging techniques has been thoroughly discussed. The introduction of scanning electron microscopes is followed by experimental analysis and a section of results which comprises of various specimen sample pictures taken to provide illustrative examples of the principles explained. The discussion forum following the results section analyzes the various effects of physical characteristics such as the working distance and effect of voltage on the image quality and resolution.
